Knolls Atomic Power Laboratory (KAPL) is seeking qualified candidates to fill the position of FIB Microscopist at its Niskayuna, New York facility.
The Knolls Atomic Power Laboratory is operated for the Department of Energy by Bechtel Marine Propulsion Corporation.
KAPL employees develop advanced nuclear propulsion technology and provide technical support for the safe and reliable operation of existing naval reactors.
The FIB Microscopist is responsible for operating and maintaining a dual-column Focused Ion Beam (FIB) microscope / Scanning Electron Microscope (SEM) analytical instrument in a test support organization to provide materials characterization and failure analysis/problem-solving investigations of materials in response to environmental testing and in-service performance.
The FIB microscopy work includes in-situ high resolution imaging, micro-chemical analysis, and site-specific 3-D feature analysis, utilizing energy dispersive spectrometry (EDS) / electron backscatter diffraction (EBSD) characterization techniques.
In addition, the individual will utilize FIB capabilities to prepare and extract FIB-prepared samples for TEM analysis as well as to identify / extract specific features in samples for other microscopy and surface analytical techniques.
The FIB Microscopist will utilize their skills with dual-column FIB / electron microscopy to evaluate material properties and provide value-added materials characterization information to materials development communities; perform data /image processing, including 3-D reconstruction and visualization of FIB imaging/analytical data; analyze and interpret comprehensive and multiple datasets; and communicate results to sponsoring groups by oral and written reports.
Selected applicants will be subjected to a federal background investigation and must meet eligibility requirements for access to classified matter.
US citizenship is required.
Job Requirements: BS / BA degree in the physical sciences (e.
g., materials, chemistry, geology, solid state physics) or engineering (e.
g., materials, metallurgy, chemistry,); Hands-on training and/or experience utilizing Focused Ion Beam (FIB) microscopy for materials sample preparation, materials characterization, and failure analysis, including 3-dimensional microstructural characterization; Demonstrated problem solving experience in areas such as metallurgy, alloy testing/development, solid inorganic materials, and/or ceramics.
Open Date : 2010-02-26 12:00: 00 Date Required : 2010-05-03 Req. Code : 1215 # of Openings : 1 Other Skills : MS or PhD degree in physical sciences, with 5 years or more experience in FIB / SEM / transmission electron microscopy (TEM) and microanalysis, including energy dispersive spectrometry (EDS) and Electron Backscatter diffraction (EBSD) techniques.
Previous work with nuclear or radioactive materials, fractographic analysis, corrosion, and/or mechanical metallurgy.
Participation in multi-disciplinary collaborative investigations and team-oriented problem solving with other materials characterization specialists, and materials scientists/engineers specializing in other associated analytical techniques (eg SEM, TEM, EPMA, XRD, Auger, XPS) Offer Relocation : Yes Exemption : Exempt Hire Type : Direct
FIB Microscopist Job in Niskayuna 12309, New York US